This new Transmission Electron Microscope (TEM) offers increased sensitivity and faster image acquisition speed, enabling in situ and operando observation without disturbing the integrity of electron beam-sensitive samples. It also incorporates fast and accurate 4D STEM technology, combining imaging and electron diffraction as well as ptychography for simultaneous detailed analysis of heavy and light atoms. In addition, its fast EDS spectroscopy and mapping guarantee accurate detection of light elements, opening up new prospects for advanced research and analysis of next-generation materials. The microscope features the following cutting-edge technologies:
- Cold cathode field effect gun and correction of spherical aberrations ;
- Controlled dose of electrons ;
- High-resolution STEM (60 picometres) ;
- Hybrid Pixel detector ;
- iDPC: Integrated differential phase contrast ;
- EDS Super X: Sensitivity and superior speed ;
- Double tilt airtight object door.
The TEM will be set up in September 2024.
This equipment was co-financed by the CPER MANIFEST, the PEPR Batteries, the FEDER, the CNRS and the RS2E.
