
Spectra 200 Transmission Electron Microscope (FEI/Thermofisher)
This new Transmission Electron Microscope (TEM) offers increased sensitivity and faster image acquisition speed, enabling in situ and operando observation without disturbing the integrity of electron beam-sensitive samples. It also incorporates fast and accurate 4D STEM technology, combining imaging and electron diffraction as well as ptychography for simultaneous detailed analysis of heavy and light atoms.… Read More »Spectra 200 Transmission Electron Microscope (FEI/Thermofisher)